The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 1984

Filed:

Nov. 30, 1983
Applicant:
Inventors:

Jenq-Sian Chang, San Jose, CA (US);

Yih-Jau Chang, Cupertino, CA (US);

Assignee:

Storage Technology Partners, Louisville, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23F / ; B44C / ; C03C / ; C03C / ;
U.S. Cl.
CPC ...
156653 ; 29571 ; 148187 ; 156656 ; 156657 ; 1566591 ; 1566611 ; 427 90 ; 430318 ;
Abstract

A self-aligning process for adding a barrier metal to the source and drain regions of metal oxide semiconductors is presented. An oxide sidewall spacer is first formed on the sides of upwardly protruding gate regions. A barrier metal is then added to the entire surface, followed by adding a layer of resist material. The resist material is added in layers with each layer spun until the top surface is nearly smooth. An anisotropical etch is done to remove the resist everywhere except over the source and drain regions, which regions are depressed due to the upwardly protruding gate region and a surrounding upwardly protruding insulating material. The exposed barrier metal is etched away and the remaining resist is stripped, leaving a layer of barrier metal only over the source and drain regions.


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