The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 1979
Filed:
Dec. 21, 1977
Applicant:
Inventors:
Assignee:
RCA Corporation, New York, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
3501 / ; 3501 / ; 427 43 ;
Abstract
Superposed fine-detail multi-level patterns (e.g., superposed diffraction gratings having specified line spacing dimensions less than 10 micrometers and specified depth dimensions less than 5 micrometers) can be fabricated by linearly adding (e.g., by evaporation) an additional two-level pattern to an existent multi-level pattern or, alternatively, by linearly subtracting (e.g., by sputter or plasma etching) an additional two-level pattern to an existent multi-level pattern.