The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Mar. 25, 2024
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Yu Chieh Yung, Hsinchu City, TW;

Chien-Fu Tseng, Taipei City, TW;

Meng-Tsan Lee, Hsinchu, TW;

Li-Han Hsu, Hsin-Chu City, TW;

An-Jhih Su, Taoyuan City, TW;

Wei-Cheng Wu, Hsinchu City, TW;

Der-Chyang Yeh, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10W 90/00 (2026.01); H10W 20/20 (2026.01); H10W 70/09 (2026.01); H10W 72/00 (2026.01); H10W 74/01 (2026.01); H10W 74/15 (2026.01);
U.S. Cl.
CPC ...
H10W 90/00 (2026.01); H10W 20/20 (2026.01); H10W 74/01 (2026.01); H10W 90/701 (2026.01); H10W 70/09 (2026.01); H10W 72/072 (2026.01); H10W 72/073 (2026.01); H10W 74/15 (2026.01); H10W 90/724 (2026.01); H10W 90/734 (2026.01);
Abstract

A manufacturing method of a semiconductor package includes: laterally covering a first die and a TIV with an insulating encapsulation, where the first die includes a semiconductor substrate and a TSV penetrating through the semiconductor substrate; recessing the semiconductor substrate, where the TSV protrudes above the semiconductor substrate; forming a patterned mask layer on the insulating encapsulation and the TIV, where the patterned mask layer exposes the semiconductor substrate and the TSV; forming a passivation material layer on the first die and the patterned mask layer, where a sidewall of the patterned mask layer is exposed by the passivation material layer; removing the patterned mask layer along with a portion of the passivation material layer on the patterned mask layer to expose the insulating encapsulation and the TIV; and removing an excess portion of the passivation material layer on the TSV to form a passivation layer laterally covering the TSV.


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Yung, Yu. (2026). Semiconductor package and manufacturing method thereof (U.S. Patent No. 12796569). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12796569

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