The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Dec. 01, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Ka-Hing Fung, Hsinchu County, TW;

Huiling Shang, Hsinchu County, TW;

Hsueh-Jen Yang, Taipei City, TW;

Wei-Yang Lee, Taipei City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 30/01 (2025.01); H10D 30/43 (2025.01); H10D 30/62 (2025.01); H10D 30/67 (2025.01); H10D 62/10 (2025.01); H10D 64/01 (2025.01); H10P 50/28 (2026.01);
U.S. Cl.
CPC ...
H10D 30/024 (2025.01); H10D 30/014 (2025.01); H10D 30/43 (2025.01); H10D 30/6215 (2025.01); H10D 30/6735 (2025.01); H10D 30/6757 (2025.01); H10D 62/121 (2025.01); H10D 64/017 (2025.01); H10P 50/283 (2026.01);
Abstract

Methods and structures for inserting disposable interposers include forming a first gate over a first fin and a first spacer layer on sidewalls of the first gate, and a second gate over a second fin and a second spacer layer on sidewalls of the second gate. The method further includes replacing, within the first fin, epitaxial layers of a second composition with disposable interposers disposed beneath the first gate and first inner spacers on opposing ends of the disposable interposers. The method further includes etching back, within the second fin, opposing lateral ends of the epitaxial layers of the second composition to form recesses disposed beneath the second spacer layer and between adjacent epitaxial layers of the first composition. The method further includes forming second inner spacers, within the second fin, within each of the recesses on the opposing lateral ends of the epitaxial layers of the second composition.


Find Patent Forward Citations

Quick Actions:

Fung, Ka-Hing. (2026). Formation of gate-all-around devices and structures thereof (U.S. Patent No. 12795972). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12795972

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