The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Feb. 20, 2024
Applicant:

Applied Materials Israel Ltd., Rehovot, IL;

Inventors:

Ganesh Kumar Mohanur Raghunathan, Bengaluru, IN;

Ubhay Kumar, Bengaluru, IN;

Shani Gat, Tel Aviv, IL;

Tal Frank, Tel Aviv, IL;

Balaji Chithugnanamoorthy, Bangalore, IN;

Rafael Bistritzer, Petach-Tikva, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 5/70 (2024.01); G06T 7/181 (2017.01); G06T 7/33 (2017.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); G06T 5/70 (2024.01); G06T 7/181 (2017.01); G06T 7/337 (2017.01); G06T 7/50 (2017.01); G06T 2207/30148 (2013.01);
Abstract

There are provided systems and methods comprising obtaining an inspection image of a semiconductor specimen, and a design image, wherein the design image is informative of design elements, determining data Dinformative of a periodic distance between design elements of the design image, which are associated with a shape meeting a similarity criterion, and using the data Dto obtain registration data between the design image and the inspection image.


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Mohanur Raghunathan, Ganesh. (2026). Registration between an inspection image and a design image (U.S. Patent No. 12784176). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12784176

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