The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

May. 01, 2023
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Duan-Fu Stephen Hsu, San Jose, CA (US);

Jialei Tang, San Jose, CA (US);

Dezheng Sun, Palo Alto, CA (US);

Assignee:

ASML NETHERLANDS B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01); G03F 1/68 (2012.01);
U.S. Cl.
CPC ...
G03F 7/70504 (2023.05); G03F 1/68 (2013.01); G03F 7/7025 (2013.01);
Abstract

Methods, apparatuses, and software are disclosed for optimization of a source and/or mask as used in lithographic manufacturing and patterning processes. One method includes determining a first pupil having a central obscuration (CO), determining a diffraction order (DO) based on a target design and a mask model, determining a first diffraction pattern (DP) based on the DO and the first pupil, the first DP including overlapping regions of diffracted light, determining a second DP based on the DO and the first pupil, and determining an initial pupil based on the first DP and the second DP, the initial pupil including at least some of the overlapping regions.


Find Patent Forward Citations

Quick Actions:

Hsu, Duan-Fu. (2026). Diffraction-based pupil determination for optimization of lithographic processes (U.S. Patent No. 12782825). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12782825

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