The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Jul. 17, 2024
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Ming-Fa Chen, Taichung City, TW;

Hsien-Wei Chen, Hsinchu City, TW;

Jie Chen, New Taipei City, TW;

Sen-Bor Jan, Tainan City, TW;

Sung-Feng Yeh, Taipei City, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10W 72/30 (2026.01); H10P 54/00 (2026.01); H10W 46/00 (2026.01); H10W 72/00 (2026.01); H10W 72/20 (2026.01); H10W 74/01 (2026.01); H10W 74/10 (2026.01);
U.S. Cl.
CPC ...
H10W 72/30 (2026.01); H10P 54/00 (2026.01); H10W 46/00 (2026.01); H10W 72/012 (2026.01); H10W 72/013 (2026.01); H10W 72/20 (2026.01); H10W 74/01 (2026.01); H10W 74/131 (2026.01); H10W 46/301 (2026.01);
Abstract

A package structure including at least one die laterally encapsulate by an encapsulant, a bonding film and an interconnect structure is provided. The bonding film is located on a first side of the encapsulant, and the bonding film includes a first alignment mark structure. The package structure further includes a semiconductor material block located on the bonding film. The interconnect structure is located on a second side of the encapsulant opposite to the first side, and the interconnect structure includes a second alignment mark structure. A location of the first alignment mark structure vertically aligns with a location of the second alignment mark structure.


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Chen, Ming-Fa. (2026). Package structure and manufacturing method thereof (U.S. Patent No. 12777957). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12777957

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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