The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Jul. 31, 2023
Applicant:

Rohm Co., Ltd., Kyoto, JP;

Inventors:

Makoto Takamura, Kyoto, JP;

Takuji Maekawa, Kyoto, JP;

Mitsuru Morimoto, Kyoto, JP;

Noriyuki Masago, Kyoto, JP;

Takayasu Oka, Kyoto, JP;

Assignee:

ROHM CO., LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 25/12 (2006.01); C23C 16/32 (2006.01); C23C 16/455 (2006.01); C23C 16/458 (2006.01); C23C 16/46 (2006.01); C30B 25/10 (2006.01); C30B 25/14 (2006.01); C30B 25/20 (2006.01); C30B 29/36 (2006.01); H10P 14/20 (2026.01);
U.S. Cl.
CPC ...
C30B 25/12 (2013.01); C23C 16/325 (2013.01); C23C 16/45502 (2013.01); C23C 16/4587 (2013.01); C23C 16/46 (2013.01); C30B 25/10 (2013.01); C30B 25/14 (2013.01); C30B 25/20 (2013.01); C30B 29/36 (2013.01); H10P 14/20 (2026.01); H10P 14/2904 (2026.01); H10P 14/3408 (2026.01);
Abstract

A fabricating apparatus () of an sic epitaxial wafer disclosed herein includes: a growth furnace (A); a gas mixing preliminary chamber () disposed outside the growth furnace and configured to mix carrier gas and/or material gas and to regulate a pressure thereof; a wafer boat () configured so that a plurality of SiC wafer pairs (WP), in which two substrates each having an SiC single crystal in contact with each other in a back-to-back manner, are disposed at equal intervals with a gap therebetween; and a heating unit () configured to heat the wafer boat disposed in the growth furnace to an epitaxial growth temperature. The carrier gas and/or the material gas are introduced into the growth furnace after preliminarily being mixed and pressure-regulated in the gas mixing preliminary chamber () to grow an SiC layer on a surface of each of the plurality of SiC wafer pairs.


Find Patent Forward Citations

Takamura, Makoto. (2026). Fabricating apparatus of sic epitaxial wafer and fabrication method of the sic epitaxial wafer (U.S. Patent No. 12768073). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12768073

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…