The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Jun. 06, 2024
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventors:

Albert Chen, Milpitas, CA (US);

Xiang Yang, Santa Clara, CA (US);

Jiahui Yuan, Fremont, CA (US);

Eric Fu, Sunnyvale, CA (US);

Assignee:

Sandisk Technologies, inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G11C 16/04 (2006.01); H10B 41/10 (2023.01); H10B 41/27 (2023.01); H10B 41/35 (2023.01); H10B 43/10 (2023.01); H10B 43/27 (2023.01); H10B 43/35 (2023.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G11C 16/0483 (2013.01); H10B 41/10 (2023.02); H10B 41/27 (2023.02); H10B 41/35 (2023.02); H10B 43/10 (2023.02); H10B 43/27 (2023.02); H10B 43/35 (2023.02);
Abstract

A memory apparatus includes memory cells connected to word lines and configured to retain a threshold voltage corresponding to data states. A control means is configured to determine ones of the data states for the memory cells of a neighboring word line adjacent to a selected word line in a pre-read. The control means determines an adjusted sense time according to a zone identified for the memory cells of the neighboring word line and the one of the data states targeted for the memory cells of the selected word line and a temperature of the memory apparatus. The control means is also configured to perform reads on the selected word line for each of a plurality of groupings of ones of the data states in a read operation using the adjusted sense time determined for each of the memory cells of the selected word line.


Find Patent Forward Citations

Chen, Albert. (2026). Variable fast look neighbor ahead to improve read accuracy (U.S. Patent No. 12763151). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12763151

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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