The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Feb. 20, 2019
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Yu Cao, Saratoga, CA (US);

Ya Luo, Saratoga, CA (US);

Yen-Wen Lu, Saratoga, CA (US);

Been-Der Chen, Milpitas, CA (US);

Rafael C. Howell, Santa Clara, CA (US);

Yi Zou, Foster City, CA (US);

Jing Su, Fremont, CA (US);

Dezheng Sun, Palo Alto, CA (US);

Assignee:

ASML NETHERLANDS, Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/70 (2012.01); G06N 3/04 (2023.01); G06N 3/0455 (2023.01); G06N 3/047 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/04 (2013.01);
Abstract

Methods of training machine learning models related to a patterning process, including a method for training a machine learning model configured to predict a mask pattern. The method including obtaining (i) a process model of a patterning process configured to predict a pattern on a substrate, wherein the process model comprises one or more trained machine learning models, and (ii) a target pattern, and training the machine learning model configured to predict a mask pattern based on the process model and a cost function that determines a difference between the predicted pattern and the target pattern.


Find Patent Forward Citations

Cao, Yu. (2026). Methods for training machine learning model for computation lithography (U.S. Patent No. 12762392). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762392

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…