The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Nov. 01, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Fanqi Wu, Sunnyvale, CA (US);

Zhenlei Shen, Milpitas, CA (US);

Jiangli Zhu, San Jose, CA (US);

Tingjun Xie, Milpitas, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G06F 11/07 (2006.01); G11C 11/56 (2006.01); G11C 16/26 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0754 (2013.01); G06F 11/073 (2013.01); G06F 11/0751 (2013.01); G11C 16/34 (2013.01); G11C 11/5642 (2013.01); G11C 16/26 (2013.01); G11C 16/3459 (2013.01); G11C 29/52 (2013.01);
Abstract

A processing device in a memory sub-system identifies a read error associated with a block and determines a charge loss value associated with the block. The processing device determines whether the charge loss value is greater than or equal to a charge loss threshold. Responsive to determining the charge loss value is greater than or equal to the charge loss threshold, the block is identified as a healthy block.


Find Patent Forward Citations

Wu, Fanqi. (2026). Block health charge loss detection for block retirement in a memory sub-system (U.S. Patent No. 12761994). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761994

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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