The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

May. 11, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chen-Liang Chu, Hsin-Chu City, TW;

Hsin-Chih Chiang, Hsinchu City, TW;

Ruey-Hsin Liu, Hsin-Chu, TW;

Ta-Yuan Kung, New Taipei City, TW;

Ta-Chuan Liao, Taichung City, TW;

Chih-Wen Yao, Hsinchu City, TW;

Ming-Ta Lei, Hsin-Chu City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 30/60 (2025.01); H03K 3/356 (2006.01); H03K 19/0185 (2006.01); H10D 30/01 (2025.01);
U.S. Cl.
CPC ...
H10D 30/601 (2025.01); H03K 3/356113 (2013.01); H03K 19/018521 (2013.01); H10D 30/0227 (2025.01);
Abstract

A medium voltage transistor of a level shifter circuit may include a p-well region in a substrate. Moreover, the medium voltage transistor may include an n-type lightly-doped source/drain (NLDD) region in which an Nsource/drain region of the medium voltage transistor is included. The light doping in the NLDD region enables a threshold voltage (Vi) to be reduced while enabling medium voltage operation at the Nsource/drain region. To reduce the amount of current leakage in the medium voltage transistor due to the light doping in the NLDD region, a buffer layer may be included over and/or on a portion of the NLDD region under a gate structure of the medium voltage transistor. The NLDD region and the thermal region of the medium voltage transistor enables the threshold voltage of the medium voltage transistor while maintaining the same current leakage performance or reducing current leakage in the medium voltage transistor.


Find Patent Forward Citations

Chu, Chen-Liang. (2026). Transistor structure and methods of formation (U.S. Patent No. 12757428). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12757428

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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