The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Jul. 25, 2024
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Yan-Chun Liu, Taichung City, TW;

Yii-Chi Lin, Taipei City, TW;

Shahaji B. More, Hsinchu City, TW;

Chih-Yu MA, Hsinchu City, TW;

Sheng-Jang Liu, Hsinchu County, TW;

Shih-Chieh Chang, Taipei City, TW;

Ching-Lun Lai, Taichung City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01); C23C 16/02 (2006.01); C23C 16/52 (2006.01); H01L 21/687 (2006.01); H10P 72/50 (2026.01); H10P 72/76 (2026.01);
U.S. Cl.
CPC ...
H10P 72/53 (2026.01); C23C 16/0209 (2013.01); C23C 16/52 (2013.01); H10P 72/7618 (2026.01);
Abstract

In some implementations, a control device may determine a spacing measurement in a first dimension between a wafer on a susceptor and a pre-heat ring of a semiconductor processing tool and/or a gapping measurement in a second dimension between the wafer and the pre-heat ring, using one or more images captured in situ during a process by at least one optical sensor. Accordingly, the control device may generate a command based on a setting associated with the process being performed by the semiconductor processing tool and the spacing measurement and/or the gapping measurement. The control device may provide the command to at least one motor to move the susceptor.


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