The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Apr. 05, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Dongxiang Liao, Cupertino, CA (US);

Tomer Tzvi Eliash, Sunnyvale, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/52 (2006.01); G11C 29/02 (2006.01);
U.S. Cl.
CPC ...
G11C 29/52 (2013.01); G11C 29/028 (2013.01);
Abstract

A method for monitoring health of a die in a memory device and dynamically adjusting a device parameter. The method includes receiving a request for performing a memory access operation on a first data unit of a memory device, and determining a value of a media state metric of the first data unit. The method further includes modifying a device parameter of the first data unit to form a modified device parameter in response to determining that the value of the media state metric of the first data unit is greater than a predetermined threshold value, and performing, using the modified device parameter, the memory access operation on the first data unit.


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