The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jan. 10, 2023
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Chung-Ting Ko, Kaohsiung City, TW;

Yu-Cheng Shiau, Hsinchu, TW;

Li-Jung Kuo, Zhubei City, TW;

Sung-En Lin, Xionglin Township, TW;

Kuo-Chin Liu, Ji-an Township, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10W 10/10 (2026.01); H10D 62/10 (2025.01); H10P 14/60 (2026.01); H10P 14/694 (2026.01); H10P 50/28 (2026.01); H10W 10/00 (2026.01);
U.S. Cl.
CPC ...
H10W 10/10 (2026.01); H10D 62/124 (2025.01); H10P 14/6319 (2026.01); H10P 14/69433 (2026.01); H10P 50/283 (2026.01); H10W 10/011 (2026.01);
Abstract

A semiconductor device and method of manufacture are provided. In some embodiments isolation regions are formed by modifying a dielectric material of a dielectric layer such that a first portion of the dielectric layer is more readily removed by an etching process than a second portion of the dielectric layer. The modifying of the dielectric material facilitates subsequent processing steps that allow for the tuning of a profile of the isolation regions to a desired geometry based on the different material properties of the modified dielectric material.


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