The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Sep. 05, 2023
Applicant:

United Microelectronics Corp., Hsin-Chu City, TW;

Inventors:

Ming-Te Lin, Hsinchu City, TW;

Wen-Chun Chang, Hsinchu City, TW;

Sung-Nien Kuo, Hsinchu City, TW;

Tzu-Chun Chen, Hsinchu City, TW;

Kuan-Cheng Su, Hsinchu City, TW;

Assignee:

UNITED MICROELECTRONICS CORP., Hsin-Chu City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 89/60 (2025.01); H10W 20/42 (2026.01);
U.S. Cl.
CPC ...
H10D 89/811 (2025.01); H10D 89/611 (2025.01); H10W 20/42 (2026.01);
Abstract

A semiconductor structure is provided in the present invention, including a substrate, a deep N-well formed in the substrate, a first well formed in the deep N-well, a first gate formed on the first well, a first source and a first drain formed respectively at two sides of the first gate in the first well, a first doped region formed in the first well, and a metal interconnect electrically connected with the first source and the first doped region, wherein an area of the deep N-well multiplied by a first parameter is a first factor, an area of the first gate multiplied by a second parameter is a second factor, and an area of the metal interconnect divided by a sum of the first factor and the second factor is less than a specification value.


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