The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Sep. 16, 2024
Sandisk Technologies, Inc., Milpitas, CA (US);
Xuan Tian, Shanghai, CN;
Liang Li, Shanghai, CN;
Tsingfa Li, Shanghai, CN;
Jiahui Yuan, Fremont, CA (US);
Sandisk Technologies, Inc., Milpitas, CA (US);
Abstract
Programming techniques disclosed herein may be used to recover from potential plane and/or die level failures. The memory system may detect evidence of a plane or die level failure that impacts memory operations performed in a target region of the blocks if a first programming technique is used in the target region. For example, the memory system may note that a significant number of blocks have memory operation failures in the target region. The storage system switches to a second programming technique for programming the target region responsive to detecting evidence of a plane or die level failure. The blocks may be tested for a reliability criterion after programming using the second programming technique in the target region of the block. The second programming technique may overcome the plane or die level failure such that blocks may continue to be used with the second programming technique.