The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Jan. 03, 2024
Mpi Corporation, Zhubei City, TW;
Stojan Kanev, Zhubei City, TW;
Chien-Hung Chen, Zhubei City, TW;
Ming-Yang Liu, Zhubei City, TW;
Yu-Hsun Hsu, Zhubei City, TW;
Yan-Cheng Chen, Zhubei City, TW;
Lin-Lin Chih, Zhubei City, TW;
MPI CORPORATION, Zhubei City, TW;
Abstract
A positioning method and probe system for performing the same, a method for operating probe system, and a method for utilizing probe system to produce a tested semiconductor device are provided. The positioning method is used for positioning a plurality of probe assemblies with an under-test device including a plurality of pads, each of the probe assemblies have at least one probe tip that corresponds to each of the pads for contact, and at least one fixed probe assembly and at least one motorized probe assembly are defined among the probe assemblies during a positioning process.