The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Feb. 22, 2024
Applicant:

Samsung Sdi Co., Ltd., Yongin-si, KR;

Inventors:

Heetaek Lim, Yongin-si, KR;

Yongseung Shin, Yongin-si, KR;

Junhaeng Cho, Yongin-si, KR;

Sungkyun Jung, Yongin-si, KR;

Seungjun Lee, Yongin-si, KR;

Joonkil Kim, Yongin-si, KR;

Assignee:

Samsung SDI Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); B21C 51/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); B21C 51/00 (2013.01);
Abstract

One or more embodiments of the present disclosure provides a clearance-measuring apparatus including an image sensor in a mold including a frame, a punch on the frame and configured to be moved in a vertical direction, and a die on the frame and spaced apart from the punch, the image sensor being configured to capture an image of a space between the punch and the die, and a controller configured to measure a clearance of the punch and the die based on the image.


Find Patent Forward Citations

Lim, Heetaek. (2026). Clearance measuring apparatus (U.S. Patent No. 12723869). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12723869

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…