The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Mar. 22, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Fu-Chiang Kuo, Hsinchu City, TW;

Yu-Hsin Fang, Kaohsiung City, TW;

Hsin-Liang Chen, Hsinchu City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/33 (2006.01); H01G 4/232 (2006.01); H10D 1/00 (2025.01); H10D 1/68 (2025.01); H10W 20/20 (2026.01); H10W 70/05 (2026.01); H10W 70/65 (2026.01); H10W 70/652 (2026.01); H10W 70/654 (2026.01); H10W 72/20 (2026.01); H10W 72/90 (2026.01); H10W 90/00 (2026.01);
U.S. Cl.
CPC ...
H01G 4/33 (2013.01); H01G 4/232 (2013.01); H10D 1/042 (2025.01); H10D 1/716 (2025.01); H10W 20/20 (2026.01); H10W 70/05 (2026.01); H10W 70/65 (2026.01); H10W 70/652 (2026.01); H10W 70/654 (2026.01); H10W 72/227 (2026.01); H10W 72/242 (2026.01); H10W 72/248 (2026.01); H10W 72/252 (2026.01); H10W 72/922 (2026.01); H10W 72/923 (2026.01); H10W 72/926 (2026.01); H10W 72/9415 (2026.01); H10W 72/942 (2026.01); H10W 72/944 (2026.01); H10W 72/952 (2026.01); H10W 72/957 (2026.01); H10W 90/724 (2026.01);
Abstract

A method of forming a semiconductor device according to the present disclosure includes forming a metal-insulator-metal (MIM) structure in a substrate and forming an interconnect structure over the substrate. The MIM structure includes first electrodes of a first polarity and second electrodes of a second polarity. The interconnect structure includes conductive paths electrically connecting to the first and second electrodes. The conductive paths are isolated from each other inside the interconnect structure. The method also includes forming first and second contact pads over the interconnect structure. The first contact pad electrically connects a first portion of the conductive paths corresponding to the first electrodes. The second contact pad electrically connects a second portion of the conductive paths corresponding to the second electrodes.


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