The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
Nov. 14, 2023
Samsung Electronics Co., Ltd., Suwon-si, KR;
Zhaohui Lv, Xi'an, CN;
Pei You, Xi'an, CN;
Penghui Sun, Xi'an, CN;
Feng Zhu, Xi'an, CN;
Ran Yang, Xi'an, CN;
Huisi Wu, Shenzhen, CN;
Wende Xie, Shenzhen, CN;
Jingyin Lin, Shenzhen, CN;
Zebin Zhao, Shenzhen, CN;
Dong Kyung Nam, Suwon-si, KR;
Jingu Heo, Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A method of estimating an optical flow includes processing, using an image processing pass, a first image and a second image separately, and estimating the optical flow based on a second image attention feature map of the first image and a second image attention feature map of the second image. The processing using the image processing pass includes extracting a feature map by encoding an image, outputting a first image fusion attention feature map by fusing row relationship information of the image with the image feature map, outputting a first image attention feature map of the image based on the first image fusion attention feature map and the image feature map, outputting a second image fusion attention feature map by fusing column relationship information of the image with the first image attention feature map, and generating a second image attention feature map of the image based on the second image fusion attention feature map and the first image attention feature map.