The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Jul. 30, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Juane Li, Milpitas, CA (US);

Amit Bhardwaj, Longmont, CO (US);

Michael Winterfeld, Firestone, CO (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 3/06 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2092 (2013.01); G06F 3/0619 (2013.01); G06F 3/064 (2013.01); G06F 3/0647 (2013.01); G06F 3/0683 (2013.01); G06F 2201/805 (2013.01);
Abstract

Various embodiments provide handling block program failure in a memory sub-system that supports zones. In particular, some embodiments described herein handle block program failure during a data write (e.g., host data write) to a cache block of a zone on a memory device on a memory sub-system, block program failure during refresh of a cache block of a zone on a memory device on a memory sub-system, block program failure during migration of data between a cache block and a non-cache block of a zone on a memory device on a memory sub-system, block program failure during refresh of a non-cache block of a zone on a memory device on a memory sub-system, or some combination thereof.


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