The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Oct. 11, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Leon Zlotnik, Camino, CA (US);

Eyal En Gad, Highland, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/106 (2013.01);
Abstract

A syndrome can be calculated by storing data in a first array of memory cells and calculating syndromes utilizing the data, a first circuitry, and the first array of memory cells. The syndromes can be copied to a second array of memory cells. A decoding operation can be performed utilizing the plurality of syndromes, the second array of memory cells, and a second circuitry, where the first circuitry and the second circuitry are independent from each other.


Find Patent Forward Citations

Quick Actions:

Zlotnik, Leon. (2026). Syndrome calculation (U.S. Patent No. 12699630). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12699630

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…