The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Sep. 28, 2023
Siemens Industry Software Inc., Plano, TX (US);
Germain Louis Fenger, Gladstone, OR (US);
Hsin-Wei Wu, Heverlee, BE;
Kiarash Ahi, San Jose, CA (US);
Siemens Industry Software Inc., Plano, TX (US);
Abstract
A computing system can obtain wafer images of integrated circuitry having physical structures and classify each of the wafer images based on image characteristics of the wafer images. The computing system can partition each of the wafer images into a plurality of blocks, analyze each of the blocks to determine which of the blocks correspond to a background portion or a contour portion of the wafer images, assign an image score to each wafer image based on the analysis of each of the blocks, and classify the wafer images based on the image scores assigned to the wafer images. The computing system can set parameters for contour extraction using at least one of the wafer images selected from each of the classifications of the wafer images, and extract contours corresponding to the physical structures of the integrated circuitry from the wafer images based, at least in part, on the parameters.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile