The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Oct. 20, 2022
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Kunapareddy Chiranjeevi, Hyderabad, IN;

Sakina Pitalwala, Bangalore, IN;

Karthik Varadarajan Rajagopal, Bangalore, IN;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/27 (2020.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/27 (2020.01);
Abstract

This disclosure describes systems, methods, and devices related to using artificial intelligence to validate performance of integrated circuit features. A device may extract, from instruction files, microinstructions source and destination registers; generate a dependency graph including macroinstructions as nodes and dependencies between macroinstructions as edges between the nodes; generate, based on the dependency graph, a frequency distribution of instructions from trace files, performance univariate autoregressive conditionally heteroscedastic (Perf uarch) stat files, and register transfer language (RTL) stat files, predictors for a machine learning model; generate, based on the Perf uarch stat files and the RTL stat files, ratios of Perf uarch stats to RTL stats as target stat ratios; generate, using the predictors and the machine learning model, predicted ratios of Perf uarch stats to RTL stats; and generate, using greedy constrained optimization, based on the target stat ratios and the predicted ratios, recommended traces for debugging.


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