The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Jun. 28, 2023
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Teruo Takizawa, Matsumoto, JP;

Kazunori Ueno, Tsuruoka, JP;

Taiki Goto, Tsuruoka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 15/08 (2006.01); H10P 14/60 (2026.01); H10P 14/692 (2026.01); H10P 72/00 (2026.01); H10P 90/00 (2026.01); H10P 95/00 (2026.01); H10W 10/10 (2026.01); H10W 20/00 (2026.01);
U.S. Cl.
CPC ...
G01P 15/0802 (2013.01); H10P 14/6519 (2026.01); H10P 14/69215 (2026.01); H10P 72/0444 (2026.01); H10P 90/1912 (2026.01); H10P 95/06 (2026.01); H10W 10/181 (2026.01); H10W 20/076 (2026.01);
Abstract

An inertial sensor includes: a substrate; an insulating film provided on a main surface of the substrate; a first semiconductor layer and a second semiconductor layer which are provided on an opposite-side surface of the insulating film from the substrate; a first oxide film provided on a first side surface of the first semiconductor layer on a second semiconductor layer side; a second oxide film provided on a second side surface of the second semiconductor layer on a first semiconductor layer side; a planarization insulating film provided above the first oxide film and the second oxide film and between the first oxide film and the second oxide film; and a wiring provided on the planarization insulating film and electrically coupled to the second semiconductor layer.


Find Patent Forward Citations

Takizawa, Teruo. (2026). Inertial sensor, method of manufacturing inertial sensor, and inertial measurement unit (U.S. Patent No. 12693307). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12693307

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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