The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Jul. 02, 2024
Applicant:

Niterra Materials Co., Ltd, Nagoya, JP;

Inventors:

Shuhei Nitta, Tokyo, JP;

Naoyuki Sanada, Kawasaki Kanagawa, JP;

Seiichi Suenaga, Yokohama Kanagawa, JP;

Katsuyuki Aoki, Yokohama Kanagawa, JP;

Kentaro Iwai, Yokohama Kanagawa, JP;

Yoshihito Yamagata, Yokohama Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2073 (2013.01);
Abstract

According to one embodiment, a crystal phase information extraction apparatus includes a first estimation unit and a second estimation unit. The first estimation unit estimates first crystal phase information on a first polycrystalline material. The second estimation unit performs, using the first crystal phase information, iterative optimization on diffraction data acquired from a second polycrystalline material having a component ratio of a crystal phase of interest smaller than that of the first polycrystalline material, and estimates second crystal phase information on the second polycrystalline material.


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