The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2026

Filed:

Nov. 15, 2024
Applicant:

Siliconware Precision Industries Co., Ltd., Taichung City, TW;

Inventors:

Hsiang-Yun Hung, Taichung City, TW;

Yi-Ren Chen, Taichung City, TW;

Chun-Yu Hsieh, Taichung City, TW;

Ping-Lin Chang, Taichung City, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B 7/04 (2006.01); B08B 3/08 (2006.01); B08B 5/02 (2006.01); B08B 7/00 (2006.01);
U.S. Cl.
CPC ...
B08B 7/04 (2013.01); B08B 3/08 (2013.01); B08B 5/02 (2013.01); B08B 7/0042 (2013.01);
Abstract

A test base cleaning line and a method thereof are provided. The test base cleaning line includes a plurality of cleaning mechanisms, a scanning device, and a moving device. The scanning device is configured for scanning a barcode on a test base to identify a type of the test base, and the moving device is configured for moving the test base to any one of the plurality of cleaning mechanisms according to the type of the test base so that the cleaning mechanism can perform a cleaning operation to the test base.


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