The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

May. 20, 2021
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Wenhui Li, San Jose, CA (US);

Praket P. Jha, San Jose, CA (US);

Mandar B. Pandit, Milpitas, CA (US);

Man-Ping Cai, Saratoga, CA (US);

Jingmei Liang, San Jose, CA (US);

Michael Wenyoung Tsiang, Milpitas, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 14/60 (2026.01); H10P 14/692 (2026.01); H10W 10/00 (2026.01); H10W 10/17 (2026.01);
U.S. Cl.
CPC ...
H10P 14/6334 (2026.01); H10P 14/6681 (2026.01); H10P 14/69215 (2026.01); H10W 10/014 (2026.01); H10W 10/17 (2026.01);
Abstract

Processing methods disclosed herein comprise forming a nucleation layer and a flowable chemical vapor deposition (FCVD) film on a substrate surface by exposing the substrate surface to a silicon-containing precursor and a reactant. By controlling at least one of a precursor/reactant pressure ratio, a precursor/reactant flow ratio and substrate temperature formation of miniature defects is minimized. Controlling at least one of the process parameters may reduce the number of miniature defects. The FCVD film can be cured by any suitable curing process to form a smooth FCVD film.


Find Patent Forward Citations

Li, Wenhui. (2026). Flowable cvd film defect reduction (U.S. Patent No. 12666886). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12666886

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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