The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Jan. 14, 2022
Applicant:

Kokusai Electric Corporation, Tokyo, JP;

Inventors:

Yuki Yamakado, Toyama, JP;

Masanori Nakayama, Toyama, JP;

Katsunori Funaki, Toyama, JP;

Tatsushi Ueda, Toyama, JP;

Yasutoshi Tsubota, Toyama, JP;

Yuichiro Takeshima, Toyama, JP;

Hiroto Igawa, Toyama, JP;

Eiko Takami, Toyama, JP;

Keita Ichimura, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); C23C 16/40 (2006.01); C23C 16/455 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32458 (2013.01); C23C 16/401 (2013.01); C23C 16/402 (2013.01); C23C 16/45512 (2013.01); C23C 16/45563 (2013.01); H01J 37/3244 (2013.01); H01J 37/32816 (2013.01);
Abstract

The present disclosure provides a method of manufacturing a semiconductor device, including: (a) loading a substrate with a film formed on a surface thereof into a process vessel; (b) generating a reactive species containing oxygen and a reactive species of a rare gas by converting a mixed gas containing the rare gas and an oxygen-containing gas into a plasma state; and (c) oxidizing the film by supplying the reactive species containing oxygen to the substrate together with the reactive species of the rare gas. In (b), a partial pressure ratio P/P, which is a ratio of a partial pressure Pof the rare gas in the process vessel to a total pressure Pof the mixed gas in the process vessel, is set to a value of 0.4 or less.


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