The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Dec. 07, 2022
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Wei-Kai Shih, Hsinchu City, TW;

Hsien-Han Cheng, Hsinchu City, TW;

Li Ding, San Jose, CA (US);

Assignee:

Synopsys, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/3315 (2020.01); G06F 30/327 (2020.01); G06F 119/04 (2020.01); G06F 119/12 (2020.01);
U.S. Cl.
CPC ...
G06F 30/3315 (2020.01); G06F 30/327 (2020.01); G06F 2119/04 (2020.01); G06F 2119/12 (2020.01);
Abstract

A system and method for performing circuit design analysis obtains a circuit design comprising cells. The cells are associated with cell types. Aging parameters of a core analytical model are determined for each of the cell types in the circuit design to generate a calibrated analytical model. Aging effects for the cells are determined based on the calibrated analytical model and target stress conditions. An aged timing model is determined for the cell types based on the aging effects, an unaged timing model, and the target stress conditions.


Find Patent Forward Citations

Shih, Wei-Kai. (2026). Determining aging effects for a circuit design (U.S. Patent No. 12657363). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12657363

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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