The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Aug. 04, 2022
Applicant:

Axcelis Technologies, Inc., Beverly, MA (US);

Inventors:

James S Deluca, Beverly, MA (US);

Dwight Roh, North Andover, MA (US);

Patrick Heres, Boxford, MA (US);

Atul Gupta, Lexington, MA (US);

Assignee:

Axcelis Technologies, Inc., Beverly, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/147 (2006.01); C23C 14/48 (2006.01); C23C 14/54 (2006.01); H01J 37/08 (2006.01); H01J 37/20 (2006.01); H01J 37/304 (2006.01); H01J 37/317 (2006.01);
U.S. Cl.
CPC ...
H01J 37/1474 (2013.01); C23C 14/48 (2013.01); C23C 14/54 (2013.01); H01J 37/08 (2013.01); H01J 37/20 (2013.01); H01J 37/304 (2013.01); H01J 37/3171 (2013.01); H01J 2237/047 (2013.01); H01J 2237/0473 (2013.01); H01J 2237/0475 (2013.01); H01J 2237/202 (2013.01); H01J 2237/2065 (2013.01); H01J 2237/2445 (2013.01); H01J 2237/2482 (2013.01);
Abstract

Ion implantation systems and methods implant varying energies of an ion beam across a workpiece in a serial single-workpiece end station, where electrodes of an acceleration/deceleration stage, bend electrode and/or energy filter control a final energy or path of the ion beam to the workpiece. The bend electrode or an energy filter can form part of the acceleration/deceleration stage or can be positioned downstream. A scanning apparatus scans the ion beam and/or the workpiece, and a power source provides varied electrical bias signals to the electrodes. A controller selectively varies the electrical bias signals concurrent with the scanning of the ion beam and/or workpiece through the ion beam based on a desired ion beam energy at the workpiece. A waveform generator can provide the variation and synchronize the electrical bias signals supplied to the acceleration/deceleration stage, bend electrode and/or energy filter.


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