The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Sep. 23, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Mustafa N. Kaynak, San Diego, CA (US);

Eyal En Gad, Fremont, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
H03M 13/116 (2013.01); H03M 13/1105 (2013.01);
Abstract

A method for error correction includes reading, by a memory controller, a first-level codeword from a memory device, the first-level codeword having user data and first-level parity data. The method includes decoding, by the memory controller responsive to determining the first-level codeword contains errors, the first-level codeword using a first-level low-density parity-check (LDPC) decoder employing a first-level H matrix having a portion with reduced column weights to reduce an average row weight for the first-level H matrix. Responsive to the first-level LDPC decoder failing to correct the errors in the first-level codeword, the memory controller decodes a second-level codeword using a second-level LDPC decoder employing a second-level H matrix that includes a portion with increased column weights to increase an average row weight of a second-level of the second-level H matrix. The second-level codeword having the user data, the first-level parity data and second-level parity data.


Find Patent Forward Citations

Kaynak, Mustafa. (2026). Row weight adjustment in two-level low-density parity-check (ldpc) error correction (U.S. Patent No. 12633943). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12633943

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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