The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Jun. 13, 2023
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Jiajie Cen, San Jose, CA (US);

Zhiyuan Wu, San Jose, CA (US);

Kevin Kashefi, San Ramon, CA (US);

Yong Jin Kim, Albany, CA (US);

Yang Zhou, Milpitas, CA (US);

Zheng Ju, Sunnyvale, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10W 20/00 (2026.01); H01J 37/32 (2006.01); H10P 50/28 (2026.01); H10W 20/41 (2026.01); H10W 20/44 (2026.01);
U.S. Cl.
CPC ...
H10W 20/034 (2026.01); H01J 37/32357 (2013.01); H01J 37/32816 (2013.01); H10P 50/287 (2026.01); H10W 20/035 (2026.01); H01J 2237/335 (2013.01); H01J 2237/336 (2013.01); H10W 20/059 (2026.01); H10W 20/425 (2026.01); H10W 20/4403 (2026.01);
Abstract

Methods of forming microelectronic devices comprise forming a dielectric layer on a substrate, the dielectric layer comprising at least one feature defining a gap including sidewalls and a bottom. The methods include forming a hardmask on the dielectric layer; selectively depositing a self-assembled monolayer (SAM) on the bottom of the gap and on the hardmask; treating the microelectronic device with a plasma to remove the self-assembled monolayer (SAM) from the hardmask; forming a barrier layer on the dielectric layer and on the hardmask; selectively depositing a metal liner on the barrier layer on the sidewall; and performing a gap fill process on the metal liner.


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