The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

May. 18, 2023
Applicant:

Gudeng Equipment Co., Ltd., New Taipei City, TW;

Inventors:

Yin-Feng Chan, New Taipei City, TW;

Lin-Hsin Tu, New Taipei City, TW;

Ming-Mo Lo, New Taipei City, TW;

Assignee:

GUDENG EQUIPMENT CO., LTD., New Taipei City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01); G03F 1/66 (2012.01); G03F 1/84 (2012.01);
U.S. Cl.
CPC ...
G03F 7/70741 (2013.01); G03F 1/66 (2013.01); G03F 1/84 (2013.01);
Abstract

An optical inspection device for a surface of a reticle pod includes a carrier platform having a carrier surface, a light source module, a photographic module, and a control module. The light source module includes first and second light sources for irradiating the carrier surface in first and second directions, respectively. An angle of an included angle between the first direction and the carrier surface is greater than an angle of an included angle between the second direction and the carrier surface. The control module is signally connected to the camera module, first light source, and second light source. The control module controls one of the first light source and second light source to turn on and the other one to turn off. An optical inspection method for a surface of a reticle pod is further provided to operate to inspect a reticle pod efficiently and precisely.


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