The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Jun. 20, 2023
Applicant:
Nanya Technology Corporation, New Taipei City, TW;
Inventors:
Chiang-Lin Shih, New Taipei City, TW;
Meng-Zhen Li, New Taipei City, TW;
Wei-Ming Liao, Taoyuan City, TW;
Hsueh Han Lu, New Taipei City, TW;
Wei Zhong Li, Taoyuan City, TW;
Assignee:
NANYA TECHNOLOGY CORPORATION, New Taipei City, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10P 74/00 (2026.01);
U.S. Cl.
CPC ...
H10P 74/273 (2026.01); H10P 74/277 (2026.01);
Abstract
This invention provides an asymmetric pads structure using at a scribe line of a wafer, comprising a test element device electrically connected to a first pad and a second pad separately, wherein a first spacing between the second pad and the test element device is sufficient to accommodate the second pad of an another asymmetric pads structure. So, two neighboring asymmetric pads structures may cross to each other to form a cross configuration.