The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

May. 08, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Hsing-Yuan Huang, Hsinchu, TW;

Chin-Szu Lee, Taoyuan, TW;

Yi Chen Ho, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 25/065 (2023.01); H10B 80/00 (2023.01);
U.S. Cl.
CPC ...
H01L 24/19 (2013.01); H01L 24/05 (2013.01); H01L 24/20 (2013.01); H01L 24/24 (2013.01); H01L 25/0657 (2013.01); H10B 80/00 (2023.02); H01L 24/32 (2013.01); H01L 24/73 (2013.01); H01L 2224/05624 (2013.01); H01L 2224/19 (2013.01); H01L 2224/215 (2013.01); H01L 2224/24011 (2013.01); H01L 2224/2405 (2013.01); H01L 2224/24146 (2013.01); H01L 2224/32221 (2013.01); H01L 2224/73267 (2013.01); H01L 2225/06527 (2013.01); H01L 2225/06568 (2013.01); H01L 2924/1431 (2013.01); H01L 2924/1437 (2013.01); H01L 2924/3511 (2013.01); H01L 2924/35121 (2013.01);
Abstract

A method includes forming a conductive pad over a substrate, forming a multi-layer passivation structure on the conducive pad, patterning a top portion of the multi-layer passivation structure to form a first opening, forming a mask film on sidewall surfaces of the patterned top portion of the multi-layer passivation structure, after the forming of the mask film, performing a first etching process to remove a portion of the multi-layer passivation structure directly under the first opening to form a second opening, after the performing of the first etching process, selectively removing the mask film, performing a second etching process to remove a portion of the multi-layer passivation structure directly under the second opening, thereby forming a third opening exposing the conductive pad, and forming a bonding structure in the third opening, where an etchant of the second etching process is different than an etchant of the first etching process.


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