The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Jun. 20, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Fanqi Wu, Sunnyvale, CA (US);

Kevin R. Brandt, Boise, ID (US);

Zhenlei Shen, Milpitas, CA (US);

Tingjun Xie, Milpitas, CA (US);

Yang Liu, San Jose, CA (US);

Jiangli Zhu, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/44 (2013.01);
Abstract

A processing device in a memory sub-system identifies a read error associated with a block and initiates a diagnostic memory access operation on the block. The processing device determines whether the diagnostic memory access operation was successfully performed on the block. Responsive to determining the diagnostic memory access operation was successfully performed on the block, the processing device initiates a diagnostic read operation on the block. The processing device determines whether the diagnostic read operation was successfully performed on the block. Responsive to determining the diagnostic read operation was successfully performed on the block, the processing device identifies the block as a healthy block.


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