The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Oct. 21, 2020
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;
Chewn-Pu Jou, Hsinchu, TW;
Min-Jer Wang, Hsinchu, TW;
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., Hsinchu, TW;
Abstract
A method of testing an integrated circuit includes connecting a conductive line to a ground voltage. The method further includes directly physically contacting the conductive line with a first conductive structure. The method further includes contacting the conductive line with a second conductive structure different from the first conductive structure. The method further includes supplying a first test voltage to the conductive line through the first conductive structure. The method further includes supplying a second test voltage to the conductive line through the second conductive structure. The method further includes generating a report indicating whether the first conductive structure is capable of carrying the first test voltage based on feedback from a first test circuit connected to the first conductive structure.