The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Aug. 04, 2023
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Chang-Yih Chen, Tainan, TW;

Yi-Wen Chen, Chiayi County, TW;

Wei-Chung Sun, Tainan, TW;

Assignee:

UNITED MICROELECTRONICS CORP., Hsin-Chu City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/75 (2013.01); H10B 20/00 (2023.01); G11C 17/18 (2006.01);
U.S. Cl.
CPC ...
H10B 20/60 (2023.02); G06F 21/75 (2013.01); G11C 17/18 (2013.01);
Abstract

A method for physically unclonable function through gate height tuning is provided in the present invention, including steps of forming a high-k dielectric layer and a dummy silicon layer on a semiconductor substrate, removing the dummy silicon layer, forming a work function layer and a metal filling layer on the high-k dielectric layer, and performing a CMP process to remove the metal filling layer, so as to form metal gates with heights lower than a critical gate height, and using the metal gates to manufacture PIO pairs in an internal bias generator. Since the height of metal gates is lower than the critical gate height, a local threshold voltage mismatching of the programmed I/O (PIO) pairs becomes larger, so as to achieve random code generation in physically unclonable function (PUF).


Find Patent Forward Citations

Chen, Chang-Yih. (2026). Method for physically unclonable function through gate height tuning (U.S. Patent No. 12588194). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12588194

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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