The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Jan. 19, 2022
Lam Research Corporation, Fremont, CA (US);
Yu Lu, Palo Alto, CA (US);
Yansha Jin, Fremont, CA (US);
Zhongkui Tan, Fremont, CA (US);
Mehmet Derya Tetiker, Santa Clara, CA (US);
Lam Research Corporation, Fremont, CA (US);
Abstract
Various embodiments herein relate to systems, methods, and media for matching pre-processing and post-processing substrate samples. In some embodiments, a computer program product for matching pre-processing and post-processing substrate samples is provided, the computer program product comprising a non-transitory computer-readable on which is provided computer-executable instructions for: receiving a plurality of samples associated with a first set of dimensions characterizing a pre-processed substrate and a plurality of samples associated with a second set of dimensions characterizing a post-processed substrate; receiving an identification of one of the pre-processed dimensions and one of the post-processed dimensions that are to be matched; generating a first probability distribution of samples for the identified pre-processed dimension and a second probability distribution of samples for the identified post-processed dimension; and matching samples of the identified pre-processed dimension to samples of the identified post-processed dimension based on the first probability distribution and the second probability distribution.