The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Mar. 29, 2023
Applicant:
Tokyo Electron Limited, Tokyo, JP;
Inventors:
Assignee:
TOKYO ELECTRON LIMITED, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/311 (2006.01); H01J 37/32 (2006.01); H01L 21/3065 (2006.01);
U.S. Cl.
CPC ...
H01L 21/31116 (2013.01); H01J 37/32128 (2013.01); H01J 37/32449 (2013.01); H01L 21/3065 (2013.01); H01J 2237/3343 (2013.01);
Abstract
An etching method includes (a) providing a substrate having a first silicon containing film and a second silicon containing film including at least a silicon containing film of which type is different from the first silicon containing film, on a substrate support in a chamber, (b) supplying a processing gas including a HF gas and a phosphorus containing gas into the chamber, and (c) etching the first silicon containing film and the second silicon containing film by generating plasma from the processing gas in the chamber by a source RF signal and generating a bias potential on the substrate by a bias signal.