The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

May. 29, 2024
Applicant:

Taiwan Semiconductor Manufacturing Company Limited, Hsinchu, TW;

Inventors:

Wu-Wei Tsai, Taoyuan City, TW;

Yu-Ming Lin, Hsinchu City, TW;

Hai-Ching Chen, Hsinchu City, TW;

Sai-Hooi Yeong, Hsinchu City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/786 (2006.01); H01L 23/528 (2006.01); H01L 27/12 (2006.01); H01L 29/66 (2006.01); H10D 30/01 (2025.01); H10D 30/67 (2025.01); H10D 87/00 (2025.01);
U.S. Cl.
CPC ...
H10D 30/6755 (2025.01); H01L 23/5283 (2013.01); H10D 30/0323 (2025.01); H10D 30/6744 (2025.01); H10D 87/00 (2025.01);
Abstract

A semiconductor device includes an insulating layer having formed therein a gate electrode and overlying a substrate, a stack of a gate dielectric including a gate dielectric material, a dielectric diffusion barrier liner including a dielectric diffusion barrier material, and an active layer overlying a top surface of the gate electrode, and a source electrode and a drain electrode contacting a respective portion of a top surface of the active layer. The dielectric diffusion barrier material is different from the gate dielectric material and is selected from a dielectric metal oxide material and a dielectric compound of silicon, and suppresses loss of metallic elements during subsequent anneal processes.


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