The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Jan. 13, 2022
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Einstein Noel Abarra, Tokyo, JP;

Hiroaki Chihaya, Yamanashi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/18 (2006.01); G01K 11/00 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
G01N 25/18 (2013.01); G01K 11/00 (2013.01); H01L 21/67248 (2013.01);
Abstract

A holder temperature detection method which measures a temperature of a rotatable holder that holds a substrate is provided. The method comprises a step of irradiating a fluorescent body thermally mounted on the holder with a light pulse having a first wavelength, a step of detecting fluorescence having a second wavelength emitted from the fluorescent body due to the light pulse and a step of estimating the temperature of the holder based on the detected fluorescence.


Find Patent Forward Citations

Abarra, Einstein. (2026). Holder temperature detection method, holder monitoring method and substrate processing apparatus (U.S. Patent No. 12553845). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12553845

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…