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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12541839 B1

PDFFull Text
Date of Patent:
Feb. 03, 2026

Filed:

Dec. 28, 2022

Method and device for determining coordinates of contact through-holes in memory device

Applicant:

Yangtze Memory Technologies Co., Ltd., Wuhan, CN;

Inventors:

Wenqi Wang, Wuhan, CN;

Guangdian Chen, Wuhan, CN;

Jinxing Chen, Wuhan, CN;

Yanli Wang, Wuhan, CN;

Zongliang Huo, Wuhan, CN;

Assignee:

Yangtze Memory Technologies Co., Ltd., Wuhan, CN;

Attorney:

Anova Law Group, PLLC

Primary Examiner:

Stephen R Koziol

Assistant Examiner:

Joshua undefined Chen

Int. Cl.
CPC ...
G06T 5/30 (2006.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01); G06V 10/28 (2022.01); G06V 10/46 (2022.01); H04N 1/40 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G06T 5/30 (2013.01); G06T 5/50 (2013.01); G06V 10/28 (2022.01); G06V 10/46 (2022.01); H04N 1/40012 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/20224 (2013.01); G06V 2201/07 (2022.01);
Abstract

A method of determining coordinates of contact through-holes (CTs) in a memory device includes: obtaining a bright voltage contrast (BVC) image including a plurality of CTs in the memory device; converting color components in the BVC image into grayscale values to obtain a grayscale BVC image; performing a dilation process on the grayscale BVC image to obtain a dilated grayscale BVC image; calculating a first threshold for the dilated grayscale BVC image and determining whether the first threshold is greater than or equal to a pre-determined value; in response to the first threshold being greater than or equal to the pre-determined value, performing a first image process on the dilated grayscale BVC image to obtain coordinates of each CT; and in response to the first threshold being smaller than the pre-determined value, performing a second image process on the dilated grayscale BVC image to obtain the coordinates of each CT.

Find Patent Forward Citations

Wang, Wenqi. (2026). Method and device for determining coordinates of contact through-holes in memory device (U.S. Patent No. 12541839). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12541839

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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