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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12536677 B1

PDFFull Text
Date of Patent:
Jan. 27, 2026

Filed:

Jul. 28, 2023

Method and apparatus for obtaining first and second images to detect first and second landmarks and face registration using 3d facial landmark

Applicant:

Kwangwoon University Industry-academic Collaboration Foundation, Seoul, KR;

Inventors:

Soonchul Kwon, Seoul, KR;

Seunghyun Lee, Seoul, KR;

Hoijun Kim, Seoul, KR;

Jaeseung Kim, Seoul, KR;

Assignee:

KWANGWOON UNIVERSITY INDUSTRY-ACADEMIC COLLABORATION FOUNDATION, Seoul, KR;

Attorney:

BROADVIEW IP LAW, PC

Primary Examiner:

Haris Sabah

Int. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 7/246 (2017.01); G06V 10/75 (2022.01); G06V 40/16 (2022.01); G06V 10/80 (2022.01); G06V 40/18 (2022.01);
U.S. Cl.
CPC ...
G06T 7/337 (2017.01); G06T 7/248 (2017.01); G06V 10/7515 (2022.01); G06V 40/161 (2022.01); G06V 10/803 (2022.01); G06V 40/16 (2022.01); G06V 40/197 (2022.01);
Abstract

Provided is a face registration method performed by a face registration apparatus, the face registration method including obtaining first face image data and second face image data that are captured at different angles, sizes, or locations, detecting a first landmark for the first face image data and a second landmark for the second face image data, calculating the amount of movement and distance between the first and second landmarks and setting a plurality of reference landmarks on the basis of the amount of movement and the distance, and matching the first and second landmarks with each other by adjusting a position, angle, and size on the basis of the plurality of reference landmarks.

Find Patent Forward Citations

Kwon, Soonchul. (2026). Method and apparatus for obtaining first and second images to detect first and second landmarks and face registration using 3d facial landmark (U.S. Patent No. 12536677). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12536677

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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