The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Jul. 11, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Andrea Martinelli, Bergamo, IT;

Ferdinando Bedeschi, Biassono, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G11C 13/00 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0655 (2013.01); G06F 3/0604 (2013.01); G06F 3/0652 (2013.01); G06F 3/0679 (2013.01); G11C 13/0004 (2013.01); G11C 13/004 (2013.01); G11C 13/0069 (2013.01); G11C 13/0097 (2013.01);
Abstract

Systems, methods, and apparatus for a memory device. In one approach, known reference patterns are stored in a memory array. The patterns are associated with codewords stored in the memory array. A first pattern has all memory cells written to a first logic state (e.g., all logic ones), and a second pattern has all memory cells written to an opposite second logic state (e.g., all logic zeros). When a controller reads a codeword, the controller first reads memory cells of the associated reference patterns to determine data for estimating a threshold voltage distribution of memory cells in the codeword. Based on a number of memory cells of the reference patterns that snap when reading the first and second patterns, the controller selects a read voltage for reading the associated codeword.


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