The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Sep. 19, 2023
Applicant:

Disco Corporation, Tokyo, JP;

Inventor:

Kazuma Sekiya, Tokyo, JP;

Assignee:

DISCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 84/03 (2025.01); B23K 26/53 (2014.01); H01L 21/304 (2006.01); B23K 101/40 (2006.01);
U.S. Cl.
CPC ...
H10D 84/035 (2025.01); B23K 26/53 (2015.10); H01L 21/304 (2013.01); H10D 84/038 (2025.01); B23K 2101/40 (2018.08);
Abstract

A wafer processing method for processing a wafer having a plurality of devices formed on a first surface thereof includes positioning a first focal point of a first laser beam at a first height and emitting the first laser beam onto the wafer from a side on which a second surface lies, thereby forming a protective layer, positioning a second focal point of a second laser beam at a second height being more distant from the first surface than the first height and emitting the second laser beam onto the wafer from the side on which the second surface lies, thereby forming a separation start position made up of a modified layer and a crack, and applying an external force to the wafer to divide the wafer at the separation start position and separating a piece including the second surface from the wafer.


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