The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Jul. 20, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Zheng-Yong Liang, Hsinchu, TW;

Wei-Ting Yeh, Hsinchu, TW;

Yu-Yun Peng, Hsinchu, TW;

Keng-Chu Lin, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 21/18 (2006.01); H01L 23/00 (2006.01); C23C 16/455 (2006.01); H01L 21/3065 (2006.01);
U.S. Cl.
CPC ...
H01L 24/83 (2013.01); H01L 21/187 (2013.01); H01L 21/2007 (2013.01); H01L 24/30 (2013.01); H01L 24/33 (2013.01); C23C 16/455 (2013.01); H01L 21/3065 (2013.01); H01L 2224/30104 (2013.01); H01L 2224/30505 (2013.01); H01L 2224/33505 (2013.01); H01L 2224/83031 (2013.01); H01L 2224/83097 (2013.01); H01L 2224/83193 (2013.01); H01L 2224/83359 (2013.01); H01L 2224/83896 (2013.01); H01L 2224/83948 (2013.01);
Abstract

A method for manufacturing a semiconductor structure includes: forming a first bonding layer on a device substrate formed with a semiconductor device so as to cover the semiconductor device, wherein the first bonding layer includes a first metal oxide material in an amorphous state; forming a second bonding layer on a carrier substrate, wherein the second bonding layer includes a second metal oxide material in an amorphous state; conducting a surface modification process on the first bonding layer and the second bonding layer; bonding the device substrate and the carrier substrate to each other through the first and second bonding layers; and annealing the first and second bonding layers so as to convert the first and second metal oxide materials from the amorphous state to a crystalline state.


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