The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Jul. 18, 2023
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Huai-Yuan Tseng, San Ramon, CA (US);

Eric N. Lee, San Jose, CA (US);

Akira Goda, Tokyo, JP;

Kishore Kumar Muchherla, San Jose, CA (US);

Tomoharu Tanaka, Kanagawa, JP;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12005 (2013.01); G11C 16/3431 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/1204 (2013.01);
Abstract

A memory device includes a memory array including wordlines and at least one string of cells. Each cell of the at least one string of cells is addressable by a respective wordline. The memory device further includes control logic, operatively coupled to the memory array, to perform operations including generating gate-induced drain leakage (GIDL) with respect to the at least one string of cells, and causing a grounding voltage to be applied to a set of wordlines to ground each cell of the at least one string of cells addressable by each wordline of the set of wordlines. The grounding voltage applied to the set of wordlines enables transport of positive charge carriers generated by the GIDL. In some embodiments, the positive charge carriers neutralize a buildup of negative charge carriers generated during a seeding phase of a program refresh operation.


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